Electromagnetic eddy current dual-purpose thickness gauge / Model number MC29WT-NEOS series
Easy measurement by automatically identifying the measurement substrate metal using a dedicated probe.
By ensuring compatibility with the probe, you can freely select connection probes that fit your applications and measurement targets. Additionally, it has become possible to equip various probes tailored to spare probes or the shape of the base material, significantly improving work efficiency. It complies with standards such as JIS K 5600, as well as regulations, internal rules, and criteria from government agencies, testing laboratories, research institutes, and various corporations and organizations, as well as international standards like ISO 2808.
- Company：シロ産業
- Price：Other
